Spatial resolution limits for synchrotron-based infrared spectromicroscopy

Infrared Physics and Technology

Volumn 51, Issue 5, 2008, Pages 413-416

  Levenson, Erika ^a   Lerch, Philippe ^b   Martin, Michael C ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Diffraction; Imaging; Microscopy; Spatial resolution; Spectromicroscopy; Synchrotron

Indexed keywords

ELECTRON BEAMS; INFRARED SPECTROSCOPY; LUMINANCE; OPTICAL BEAM SPLITTERS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SYNCHROTRON RADIATION;

BEAMLINES; ELECTRON BEAM SOURCES; SPATIAL RESOLUTION; SPECTROMICROSCOPY;

INFRARED RADIATION;

EID: 42649122294     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infrared.2007.12.004     Document Type: Article

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