Parallel two-step phase-shifting point-diffraction interferometry for microscopy based on a pair of cube beamsplitters

Optics Express

Volumn 19, Issue 3, 2011, Pages 1930-1935

  Gao, Peng ^a,d   Yao, Baoli ^a   Min, Junwei ^a   Guo, Rongli ^a   Zheng, Juanjuan ^a   Ye, Tong ^a   Harder, Irina ^b   Nercissian, Vanusch ^c   Mantel, Klaus ^b  

^a XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

^b MAX PLANCK INSTITUTE FOR THE SCIENCE OF LIGHT   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^d UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; INTERFEROMETRY;

BEAMSPLITTERS; COMMON-PATH; DYNAMIC PROCESS; FOURIER PLANES; INTERFEROGRAMS; MOVING OBJECTS; OBJECT WAVES; OFF-AXIS; PHASE-SHIFTING; POINT DIFFRACTION INTERFEROMETRY; POLARIZATION ELEMENTS; REFERENCE WAVES; TWO BEAMS; TWO PHASE;

GEOMETRY;

ARTICLE; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; INTERFEROMETRY; POLARIZATION MICROSCOPY; REFRACTOMETRY;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; INTERFEROMETRY; MICROSCOPY, POLARIZATION; REFRACTOMETRY;

EID: 79851483812     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.001930     Document Type: Article

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