-
1
-
-
0001418962
-
C.14 Phase shifting interferometry
-
D. Malacara, ed, John Wiley & Sons
-
J. E. Greivenkamp and J. H. Bruning, "C.14 Phase shifting interferometry," in Optical Shop Testing, D. Malacara, ed. (John Wiley & Sons, 1992), pp. 501-598.
-
(1992)
Optical Shop Testing
, pp. 501-598
-
-
Greivenkamp, J.E.1
Bruning, J.H.2
-
2
-
-
77956979212
-
Advanced evaluation techniques in interferometry,
-
E. Wolf, ed, North-Holland
-
J. Schwider, "Advanced evaluation techniques in interferometry, " in Progress in Optics, E. Wolf, ed. (North-Holland, 1990), pp. 271-359.
-
(1990)
Progress in Optics
, pp. 271-359
-
-
Schwider, J.1
-
3
-
-
77956978378
-
Phase-measurement interferometry techniques
-
E. Wolf, ed, North-Holland
-
K. Creath, "Phase-measurement interferometry techniques," in Progress in Optics, E. Wolf, ed. (North-Holland, 1998), 26 pp. 349-393.
-
(1998)
Progress in Optics
, vol.26
, pp. 349-393
-
-
Creath, K.1
-
4
-
-
84975607749
-
Shearing interferometer for phase shifting interferometry with polarization phase shifter
-
M. P. Kothiyal and C. Delisle, "Shearing interferometer for phase shifting interferometry with polarization phase shifter," Appl. Opt. 44, 4439-4442 (1985).
-
(1985)
Appl. Opt
, vol.44
, pp. 4439-4442
-
-
Kothiyal, M.P.1
Delisle, C.2
-
5
-
-
0009546751
-
Transient Deformation Measurement with Electronic Speckle Pattern interferometry by Use of a Holographic Optical Element for Spatial Phase Stepping
-
B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, "Transient Deformation Measurement with Electronic Speckle Pattern interferometry by Use of a Holographic Optical Element for Spatial Phase Stepping," Appl. Opt. 38, 5944-5947 (1999).
-
(1999)
Appl. Opt
, vol.38
, pp. 5944-5947
-
-
Barrientos-García, B.1
Moore, A.J.2
Pérez-López, C.3
Wang, L.4
Tschudi, T.5
-
6
-
-
0342526644
-
Spatial Phase-Stepped Interferometry Using a Holographic Optical Element
-
B. Barrientos-García, A. J. Moore, C. Pérez-López, L. Wang, and T. Tschudi, "Spatial Phase-Stepped Interferometry Using a Holographic Optical Element," Opt. Eng. 38, 2069-2074 (1999).
-
(1999)
Opt. Eng
, vol.38
, pp. 2069-2074
-
-
Barrientos-García, B.1
Moore, A.J.2
Pérez-López, C.3
Wang, L.4
Tschudi, T.5
-
7
-
-
27944454812
-
Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer
-
M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant, "Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer," Appl. Opt. 44, 6861-6868 (2005).
-
(2005)
Appl. Opt
, vol.44
, pp. 6861-6868
-
-
Novak, M.1
Millerd, J.2
Brock, N.3
North-Morris, M.4
Hayes, J.5
Wyant, J.6
-
8
-
-
0038184302
-
Methods and Apparatus for Splitting, Imaging, and Measuring Wavefronts in Interferometry,
-
US Pat. 6552808B2 2002
-
James E Miller et al. "Methods and Apparatus for Splitting, Imaging, and Measuring Wavefronts in Interferometry," US Pat. 6552808B2 (2002).
-
-
-
Miller, J.E.1
-
9
-
-
0038184302
-
Methods and Apparatus for Splitting, Imaging, and Measuring Wavefronts in Interferometry,
-
US Pat. 20030053071A1 2003
-
James E Miller et al. "Methods and Apparatus for Splitting, Imaging, and Measuring Wavefronts in Interferometry," US Pat. 20030053071A1 (2003).
-
-
-
Miller, J.E.1
-
10
-
-
33746214862
-
Common-path phase-shifting interferometer with binary grating
-
C. Meneses-Fabian, G. Rodríguez-Zurita, and V. Arrizón, "Common-path phase-shifting interferometer with binary grating," Opt. Commun. 264, 13-17 (2006).
-
(2006)
Opt. Commun
, vol.264
, pp. 13-17
-
-
Meneses-Fabian, C.1
Rodríguez-Zurita, G.2
Arrizón, V.3
-
11
-
-
33644558028
-
Optical Tomography of Transparent Objects with Phase-Shifting Interferometry and Stepping Wise Shifted Ronchi Ruling
-
C. Meneses-Fabian, G. Rodríguez-Zurita, and V. Arrizón, "Optical Tomography of Transparent Objects with Phase-Shifting Interferometry and Stepping Wise Shifted Ronchi Ruling," J. Opt. Soc. Am. A 23, 298-305 (2006)
-
(2006)
J. Opt. Soc. Am. A
, vol.23
, pp. 298-305
-
-
Meneses-Fabian, C.1
Rodríguez-Zurita, G.2
Arrizón, V.3
-
12
-
-
0015159960
-
Interference Method for Pattern Comparison
-
H. Weinberger and U. Almi, "Interference Method for Pattern Comparison," Appl. Opt. 10, 2482-2487 (1971).
-
(1971)
Appl. Opt
, vol.10
, pp. 2482-2487
-
-
Weinberger, H.1
Almi, U.2
-
13
-
-
84975625172
-
Semiconductor Wafer and Technical Flat Planeness Testing Interferometer
-
J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna, and R. Spolaczyk, "Semiconductor Wafer and Technical Flat Planeness Testing Interferometer," Appl. Opt. 25, 1117-1121 (1986).
-
(1986)
Appl. Opt
, vol.25
, pp. 1117-1121
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Grzanna, J.4
Spolaczyk, R.5
-
16
-
-
0015630975
-
Image Subtraction by Polarization-Shifted Periodic Carrier
-
S. R. Dashiell and A. W. Lohmann, "Image Subtraction by Polarization-Shifted Periodic Carrier," Opt. Commun. 8, 100-102 (1973).
-
(1973)
Opt. Commun
, vol.8
, pp. 100-102
-
-
Dashiell, S.R.1
Lohmann, A.W.2
-
17
-
-
0346007938
-
Common-Path Interferometry with One-Dimensional Periodic Filters
-
V. Arrizón and D. Sánchez-De-La-Llave, "Common-Path Interferometry with One-Dimensional Periodic Filters," Opt. Lett. 29, 141-143 (2004).
-
(2004)
Opt. Lett
, vol.29
, pp. 141-143
-
-
Arrizón, V.1
Sánchez-De-La-Llave, D.2
|