The Use of atomic force microscopy to study crack tips in glass

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 42, Issue 2, 2011, Pages 267-278

  Wiederhorn, Sheldon M ^a   Guin, Jean Pierre ^b   Fett, Theo ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITÉ DE RENNES 1   (France)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ALKALI ION; ATOMIC FORCE MICROSCOPES; BASIC SOLUTIONS; CORROSION PROCESS; CRACK GROWTH; CRACK GROWTH DATA; CRACK MOTION; CRACK SURFACES; CRACK VELOCITIES; DIRECT OBSERVATION; EXCHANGE PROCESS; EXPERIMENTAL DATA; EXPERIMENTAL EVIDENCE; EXPERIMENTAL TECHNIQUES; FATIGUE LIMIT; FRACTURE SURFACES; GLASS SURFACES; HYDRONIUM IONS; ION EXCHANGE MECHANISMS; SILICA GLASS; SODA LIME GLASS; SODA LIME SILICATE GLASS; SODIUM IONS; STRESS CORROSION; SUBCRITICAL CRACK GROWTH; TIP BLUNTING; TIP DISPLACEMENT; WATER CONDENSATION;

ALKALINITY; ATOMIC FORCE MICROSCOPY; CORROSION FATIGUE; CRACK PROPAGATION; CRACK TIPS; FUSED SILICA; GLASS; HYDROGEN EMBRITTLEMENT; ION EXCHANGE; ION SOURCES; LIME; METAL IONS; SILICA; SILICATES; STRESS CORROSION CRACKING;

CRACKING (CHEMICAL);

EID: 79751538570     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-010-0411-3     Document Type: Conference Paper

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