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Volumn 199, Issue , 2007, Pages 13-23

Investigation of the subcritical crack growth process in glass by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGES; ATOMIC FORCE MICROSCOPES; ATOMIC FORCES; CAVITY FORMATIONS; CRACK ADVANCES; CRACK SURFACES; CRACK VELOCITIES; FIRST ORDERS; FRACTURE SURFACES; GAUSSIAN LAWS; QUADRATIC DISTORTIONS; QUANTITATIVE COMPARISONS; SILICA GLASSES; STANDARD DEVIATIONS; SUBCRITICAL CRACK GROWTHS;

EID: 38148999377     PISSN: 10421122     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.