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Journal of Alloys and Compounds

Volumn 509, Issue 9, 2011, Pages 3817-3821

Dielectric properties of soft chemical method derived CaCu 3Ti4O12 thin films onto Pt/TiO2/Si(1 0 0) substrates

(5) Moura, F b Aguiar, E C a Longo, E a Varela, J A a Simoes A Z a

a SÃO PAULO STATE UNIVERSITY UNESP (Brazil)

b FEDERAL UNIVERSITY OF ITAJUBÁ (Brazil)

Author keywords

Chemical synthesis; Dielectrics; Thin films; X ray diffraction

Indexed keywords

CALCIUM COMPOUNDS; COPPER COMPOUNDS; DIELECTRIC LOSSES; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES OF SOLIDS; EQUIVALENT CIRCUITS; PERMITTIVITY; PLATINUM COMPOUNDS; RESISTORS; SILICON COMPOUNDS; SYNTHESIS (CHEMICAL); TITANIUM COMPOUNDS; X RAY DIFFRACTION;

CALCIUM COPPER TITANATES; DIELECTRIC PERMITTIVITIES; DUPLEX MICROSTRUCTURES; IMPEDANCE ANALYSIS; INTERFACIAL BARRIERS; SOFT CHEMICAL METHOD; SPACE GROUPS; TWO-RESISTORS;

THIN FILMS;

EID: 79551684193 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2010.12.184 Document Type: Review

Times cited : (25)

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