A study of inner process double-resonance Raman scattering in bilayer graphene

Carbon

Volumn 49, Issue 5, 2011, Pages 1511-1515

  Mafra, D L ^a   Moujaes, E A ^a   Doorn, S K ^b   Htoon, H ^b   Nunes, R W ^a   Pimenta, M A ^a  

^a FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; EXCITATION LASERS; EXPERIMENTAL TECHNIQUES; INNER PROCESS; RAMAN FEATURE; RESONANCE RAMAN; RESONANCE RAMAN SCATTERING;

DENSITY FUNCTIONAL THEORY; DIRECT REDUCTION PROCESS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; LASER EXCITATION; RAMAN SCATTERING; RESONANCE; STORM SEWERS;

GRAPHENE;

EID: 79551682613     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2010.11.053     Document Type: Article

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