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Applied Physics Letters

Volumn 98, Issue 4, 2011, Pages

Misfit relaxation of La0.7Sr0.3MnO3 thin films by a nanodot segregation mechanism

(5) Abellan P a Moreno, C a Sandiumenge, F a Obradors, X a Casanove, M J b

a UNIVERSITAT AUTÒNOMA DE BARCELONA (Spain)

b CEMES CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL THICKNESS; FILM SURFACES; FILM-SUBSTRATE INTERFACES; MISFIT STRAINS; MORPHOLOGICAL EVOLUTION; NANODOTS; RELAXATION MECHANISM; SEGREGATION MECHANISM; SELF ASSEMBLED STRUCTURES;

ELECTRIC RESISTANCE; MAGNETIC FIELD EFFECTS; MAGNETORESISTANCE; MANGANESE OXIDE; NANOCOMPOSITES;

NANOCOMPOSITE FILMS;

EID: 79551624504 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3549182 Document Type: Article

Times cited : (17)

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