Strain relaxation of self-nanostructured solution derived La 0.7Sr0.3MnO3 films

Materials Research Society Symposium Proceedings

Volumn 1174, Issue , 2009, Pages 27-32

  Abellan, P ^a   Sandiumenge, F ^a   Moreno, C ^a   Casanove, M J ^b   Puig, T ^a   Obradors, X ^a  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LANTHANUM COMPOUNDS; MANGANESE COMPOUNDS; MAPPING; METALS; MICROSTRUCTURAL EVOLUTION; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; STRAIN RELAXATION; THICK FILMS;

DISLOCATION MECHANISMS; KINETIC LIMITATIONS; MISFIT STRAIN RELAXATION; MISFIT STRAINS; NANO STRUCTURATION; NANO-STRUCTURED; PLASTIC RELAXATION; RECIPROCAL SPACE MAPPING;

STRONTIUM COMPOUNDS;

EID: 72749124242     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1174-v04-12     Document Type: Conference Paper

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