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Volumn 19, Issue 1, 2011, Pages

Stress-induced roughness development during oxide scale growth on a metallic alloy for SOFC interconnects

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY PROPAGATION; CHROMIA SCALE; COUPLED STRESS; FERRITIC STAINLESS STEEL; GROWTH STRESS; HIGH TEMPERATURE; LOCAL OXIDATION; MAIN PARAMETERS; MATERIAL SYSTEMS; MECHANICAL FAILURES; MECHANICAL RESISTANCE; METALLIC ALLOYS; NONUNIFORM; NONUNIFORM STRESS FIELDS; OXIDE SCALE GROWTH; OXIDE/METAL INTERFACES; PROTECTIVE OXIDES; ROUGHNESS DEVELOPMENT; SIMULATION TOOL; STRESS AND STRAIN; STRESS-INDUCED;

EID: 79551570641     PISSN: 09650393     EISSN: 1361651X     Source Type: Journal    
DOI: 10.1088/0965-0393/19/1/015009     Document Type: Article
Times cited : (12)

References (46)
  • 1
    • 34548122753 scopus 로고    scopus 로고
    • Hou P Y et al 2007 Acta Mater. 55 5601-13
    • (2007) Acta Mater. , vol.55 , pp. 5601-5613
    • Hou, P.Y.1
  • 33
    • 79551516306 scopus 로고    scopus 로고
    • ThyssenKrupp-VDM 2005 Material data sheet No 4046: Crofer 22 APU, Werdohl, Germany, 2005
    • ThyssenKrupp-VDM 2005 Material data sheet No 4046: Crofer 22 APU, Werdohl, Germany, 2005


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.