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Volumn 50, Issue 4, 2011, Pages 579-585

Fabrication of ellipticity-controlled microlens arrays by controlling the parameters of the multiple-exposure two-beam interference technique

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROLENSES; MICROOPTICS; OPTICAL INSTRUMENT LENSES; PHOTORESISTS; SCANNING ELECTRON MICROSCOPY;

EID: 79551566002     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.000579     Document Type: Article
Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.