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Volumn 20, Issue 1, 2011, Pages 288-292

Passive polarimetric imagery-based material classification robust to illumination source position and viewpoint

Author keywords

Index of refraction estimation; pBRDF modeling; polarimetric imaging

Indexed keywords

COMPLEX INDEX OF REFRACTION; ELECTROMAGNETIC RADIATION; ILLUMINATION SOURCES; INDEX OF REFRACTION ESTIMATION; MATERIAL CLASSIFICATION; MODEL BASED APPROACH; PBRDF MODELING; POLARIMETRIC IMAGE; POLARIMETRIC IMAGERY; POLARIMETRIC IMAGING; TARGET CLASSIFICATION; TRANSVERSE ELECTRIC FIELD;

EID: 79551520687     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2010.2052274     Document Type: Article
Times cited : (38)

References (25)
  • 1
    • 33749862682 scopus 로고    scopus 로고
    • Review of passive imaging polarimetry for remote sensing applications
    • August
    • J. S. Tyo, D. L. Goldstein, D. B. Chenault, and J. A. Shaw, "Review of passive imaging polarimetry for remote sensing applications," Appl. Opt., vol. 45, no. 22, pp. 5453-5469, August 2006.
    • (2006) Appl. Opt. , vol.45 , Issue.22 , pp. 5453-5469
    • Tyo, J.S.1    Goldstein, D.L.2    Chenault, D.B.3    Shaw, J.A.4
  • 2
    • 0025521551 scopus 로고
    • A polarization-based material classification from specular reflection
    • Nov.
    • L.B.Wolff,"A polarization-based material classification from specular reflection," IEEE Trans. Pattern Anal. Mach. Intell., vol. 12, no. 11, pp. 1059-1071, Nov. 1990.
    • (1990) IEEE Trans. Pattern Anal. Mach. Intell. , vol.12 , Issue.11 , pp. 1059-1071
    • Wolff, L.B.1
  • 3
    • 0029713920 scopus 로고    scopus 로고
    • Polarization phase-based method for maate-rial classification and object recognition in computer vision
    • Jun.
    • H. Chen and L. B. Wolff, "Polarization phase-based method for maate-rial classification and object recognition in computer vision," in Proc. IEEE Comput. Soc. Conf. Comput. Vis. Pattern Recognit., Jun. 1996, pp. 128-135.
    • (1996) Proc. IEEE Comput. Soc. Conf. Comput. Vis. Pattern Recognit. , pp. 128-135
    • Chen, H.1    Wolff, L.B.2
  • 4
    • 0032094831 scopus 로고    scopus 로고
    • Polarization phase-based method for material classification in computer vision
    • Jun.
    • H. Chen and L. B. Wolff, "Polarization phase-based method for material classification in computer vision," Int. J. Comput. Vis., vol. 28, no. 1, pp. 73-83, Jun. 1998.
    • (1998) Int. J. Comput. Vis. , vol.28 , Issue.1 , pp. 73-83
    • Chen, H.1    Wolff, L.B.2
  • 5
    • 0032629650 scopus 로고    scopus 로고
    • Fusion of hydice hyperspectral data with panchromatic imagery for catographic feature extraction
    • Mar.
    • D. M. McKeown, S. D. Cochran, S. J. Ford, J. C. McGlone, J. A. Shufelt, and D. A. Yocum, "Fusion of hydice hyperspectral data with panchromatic imagery for catographic feature extraction," IEEE Trans. Geosci. Remote Sens., vol. 37, no. 3, pt. I, pp. 1261-1277, Mar. 1999.
    • (1999) IEEE Trans. Geosci. Remote Sens. , vol.37 , Issue.3 PART 1 , pp. 1261-1277
    • McKeown, D.M.1    Cochran, S.D.2    Ford, S.J.3    McGlone, J.C.4    Shufelt, J.A.5    Yocum, D.A.6
  • 7
    • 57849102968 scopus 로고    scopus 로고
    • Reflectance-based material classification for printed circuit boards
    • S. Tominaga and S. Okamoto, "Reflectance-based material classification for printed circuit boards," in Proc. 12th Conf. Image Anal. Process., 2003, pp. 238-244.
    • (2003) Proc. 12th Conf. Image Anal. Process. , pp. 238-244
    • Tominaga, S.1    Okamoto, S.2
  • 8
    • 0345134336 scopus 로고    scopus 로고
    • Using polarimetric imaging for material classification
    • Barcelona, Spain, Sep.
    • J. Zallat, P. Grabbling, and Y. V. Takakura, "Using polarimetric imaging for material classification," in Proc. IEEE Int. Conf. Image Process., Barcelona, Spain, Sep. 2003, pp. 827-830.
    • (2003) Proc. IEEE Int. Conf. Image Process. , pp. 827-830
    • Zallat, J.1    Grabbling, P.2    Takakura, Y.V.3
  • 9
    • 0036576948 scopus 로고    scopus 로고
    • Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces
    • May
    • R. G. Priest and S. R. Meier, "Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces," Opt. Eng., vol. 41, no. 5, pp. 988-993, May 2002.
    • (2002) Opt. Eng. , vol.41 , Issue.5 , pp. 988-993
    • Priest, R.G.1    Meier, S.R.2
  • 10
    • 0001136317 scopus 로고
    • Algorithms for the solution of the nonlinear least-sqaures problem
    • Oct.
    • P. Gill and W. Murray, "Algorithms for the solution of the nonlinear least-sqaures problem," SIAM J. Numer. Anal., vol. 15, pp. 977-992, Oct. 1978.
    • (1978) SIAM J. Numer. Anal. , vol.15 , pp. 977-992
    • Gill, P.1    Murray, W.2
  • 11
    • 0000092297 scopus 로고    scopus 로고
    • Emission polarization of roughened glass and aluminum surfaces
    • D. Jordan, G. Lewis, and E. Jakeman, "Emission polarization of roughened glass and aluminum surfaces,"Appl. Opt., vol. 35, pp. 3583-3590, 1996.
    • (1996) Appl. Opt. , vol.35 , pp. 3583-3590
    • Jordan, D.1    Lewis, G.2    Jakeman, E.3
  • 12
    • 33747340822 scopus 로고    scopus 로고
    • Reflective and polarimetric characteristics of urban materials
    • Polarization: Measurement, Analysis, and Remote Sensing VII
    • D. Jones, D. Goldstein, and J. Spaulding, D. H. Goldstein and D. B. Chenault, Eds., "Reflective and polarimetric characteristics of urban materials," Proc. SPIE, vol. 6240, Polarization: Measurement, Analysis, and Remote Sensing VII, p. 62400A, 2006.
    • (2006) Proc. SPIE , vol.6240
    • Jones, D.1    Goldstein, D.2    Spaulding, J.3    Goldstein, D.H.4    Chenault, D.B.5
  • 13
  • 14
    • 77950810488 scopus 로고    scopus 로고
    • Passive polarimetric imagery based material classification for remote sensing applications
    • Santa Fe, NM
    • V. Thilak, C. D. Creusere, and D. G. Voelz, "Passive polarimetric imagery based material classification for remote sensing applications," in IEEE Southwest Symp. Image Anal. Interp., Santa Fe, NM, 2008, pp. 153-156.
    • (2008) IEEE Southwest Symp. Image Anal. Interp. , pp. 153-156
    • Thilak, V.1    Creusere, C.D.2    Voelz, D.G.3
  • 16
    • 0004038250 scopus 로고    scopus 로고
    • Reading, MA: Addison-Wesley
    • E. Hecht, Optics. Reading, MA: Addison-Wesley, 2005.
    • (2005) Optics
    • Hecht, E.1
  • 17
    • 0003881170 scopus 로고
    • New York: McGraw-Hill
    • M. Bass, Handbook of Optics Vol. 1. New York: McGraw-Hill, 1995.
    • (1995) Handbook of Optics , vol.1
    • Bass, M.1
  • 18
    • 33747370971 scopus 로고    scopus 로고
    • Ph.D. dissertation Rochester Inst. Technol., Rochester, NY Nov. [Online]
    • J. R. Shell, "Polarimetric remote sensing in the visible to near infrared" Ph.D. dissertation, Rochester Inst. Technol., Rochester, NY, Nov. 2005 [Online]. Available: http://dirsig.cis.rit.edu/docs/
    • (2005) Polarimetric Remote Sensing in the Visible to Near Infrared"
    • Shell, J.R.1
  • 19
    • 79551540478 scopus 로고    scopus 로고
    • Nonconventional Exploitation Factors (nef) Modeling v 9.5 NMA-NEFMod9.5, 2005.
    • Nonconventional Exploitation Factors (nef) Modeling v 9.5 NMA-NEFMod9.5, 2005.
  • 20
    • 37549057991 scopus 로고    scopus 로고
    • Polarization-based index of refraction and reflection angle estimation for remote sensing applications
    • Oct.
    • V. Thilak, D. G. Voelz, and C. D. Creusere, "Polarization-based index of refraction and reflection angle estimation for remote sensing applications," Appl. Opt., vol. 46, no. 30, pp. 7527-7536, Oct. 2007.
    • (2007) Appl. Opt. , vol.46 , Issue.30 , pp. 7527-7536
    • Thilak, V.1    Voelz, D.G.2    Creusere, C.D.3
  • 24
    • 0001397551 scopus 로고
    • Theory of off-specular reflection from roughened surfaces
    • Sep.
    • K. E. Torrance and E. M. Sparrow, "Theory of off-specular reflection from roughened surfaces," J. Opt. Soc. Amer., vol. 57, no. 9, pp. 1105-1114, Sep. 1967.
    • (1967) J. Opt. Soc. Amer. , vol.57 , Issue.9 , pp. 1105-1114
    • Torrance, K.E.1    Sparrow, E.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.