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Volumn 4, Issue , 2007, Pages

Material classification using passive polarimetric imagery

Author keywords

Illumination invariant object recognition; Material classification; Passive polarimetry; Remote sensing; Stokes vector

Indexed keywords

ELLIPSOMETRY; IMAGE CLASSIFICATION; ITERATIVE METHODS; OBJECT RECOGNITION; POLARIMETERS; REFRACTIVE INDEX; REMOTE SENSING;

EID: 48149091108     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2007.4379969     Document Type: Conference Paper
Times cited : (21)

References (10)
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    • (1990) IEEE Trans. on Pattern Anal. Mach. Intell , vol.12 , Issue.11 , pp. 1059-1071
    • Wolff, L.B.1
  • 2
    • 0345134336 scopus 로고    scopus 로고
    • J. Zallat, P. Grabbling, and Y. V. Takakura, Using Polarimetrie imaging for material classification, Proc. 2003 International Conf. on Image Processing, 2, pp. II-827-30 3, 2003.
    • J. Zallat, P. Grabbling, and Y. V. Takakura, "Using Polarimetrie imaging for material classification," Proc. 2003 International Conf. on Image Processing, vol. 2, pp. II-827-30 vol.3, 2003.
  • 4
    • 0742303133 scopus 로고    scopus 로고
    • Target detection with a liquid crystal-based passive stokes Polarimeter
    • F. Goudail, P. Terrier, Y. Takakura, L. Bigu, F. Galland, and V. DeVlaminck, "Target detection with a liquid crystal-based passive stokes Polarimeter," Appl. Opt., vol. 43(2), pp. 274-282, 2004.
    • (2004) Appl. Opt , vol.43 , Issue.2 , pp. 274-282
    • Goudail, F.1    Terrier, P.2    Takakura, Y.3    Bigu, L.4    Galland, F.5    DeVlaminck, V.6
  • 5
    • 37549022512 scopus 로고    scopus 로고
    • Estimating the complex index of refraction and view angle of an object using multiple polarization measurements
    • V. Thilak, D. G. Voelz, and C. D. Creusere, "Estimating the complex index of refraction and view angle of an object using multiple polarization measurements," Proc. Fortieth Asilomar Conf. Signals, Systems and Computers, pp. 1067-1071, 2006.
    • (2006) Proc. Fortieth Asilomar Conf. Signals, Systems and Computers , pp. 1067-1071
    • Thilak, V.1    Voelz, D.G.2    Creusere, C.D.3
  • 7
    • 0036576948 scopus 로고    scopus 로고
    • Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces
    • R. G. Priest and S. R. Meier, "Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces," Opt. Eng., vol. 41(5), pp. 988-993, 2002.
    • (2002) Opt. Eng , vol.41 , Issue.5 , pp. 988-993
    • Priest, R.G.1    Meier, S.R.2
  • 9
    • 42149172600 scopus 로고    scopus 로고
    • M.S. thesis, Electrical and Computer Engineering, New Mexico State University
    • S. Damarla, Automation and testing of an imaging Polarimeter, M.S. thesis, Electrical and Computer Engineering, New Mexico State University, 2006.
    • (2006) Automation and testing of an imaging Polarimeter
    • Damarla, S.1
  • 10
    • 85026375576 scopus 로고    scopus 로고
    • "Luxpop," http://www.luxpop.com/.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.