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Volumn , Issue , 2008, Pages 153-156

Passive polarimetric imagery based material classification for remote sensing applications

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION APPROACH; CLASSIFICATION METHODS; COMPLEX INDEX OF REFRACTION; MATERIAL CLASSIFICATION; MATERIAL COMPOSITIONS; MODEL-BASED METHOD; MULTIPLE POLARIZATIONS; NEAREST NEIGHBOR RULE; PASSIVE IMAGING POLARIMETRY; POLARIMETRIC IMAGERY; REMOTE SENSING APPLICATIONS; SHAPE EXTRACTION; SPECULAR OBJECTS; TARGET DETECTION; TARGETS OF INTEREST;

EID: 77950810488     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SSIAI.2008.4512308     Document Type: Conference Paper
Times cited : (9)

References (13)
  • 1
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    • McGraw Hill, New York
    • M. Bass. Handbook of Optics vol. 1. McGraw Hill, New York, 1995.
    • (1995) Handbook of Optics , vol.1
    • Bass, M.1
  • 5
    • 0036576948 scopus 로고    scopus 로고
    • Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces
    • May
    • R. G. Priest and S. R. Meier. Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces. Opt. Eng., 41(5):988-993, May 2002.
    • (2002) Opt. Eng. , vol.41 , Issue.5 , pp. 988-993
    • Priest, R.G.1    Meier, S.R.2
  • 7
    • 48149091108 scopus 로고    scopus 로고
    • Material classification from passive polarimetric imagery
    • Sept
    • V. Thilak, C. D. Creusere, and D. G. Voelz. Material classification from passive polarimetric imagery. In Proc. IEEE Int'l Conf. Image Proc., volume IV, pages 121-124, Sept. 2007.
    • (2007) Proc. IEEE Int'l Conf. Image Proc. , vol.4 , pp. 121-124
    • Thilak, V.1    Creusere, C.D.2    Voelz, D.G.3
  • 8
    • 42149193290 scopus 로고    scopus 로고
    • Image segmentation from multi-look passive polarimetric imagery
    • DOI 10.1117/12.731503, Polarization Science and Remote Sensing III
    • V. Thilak, D. G. Voelz, and C. D. Creusere. Image segmentation from multi-look passive polarimetric imagery. In Polarization Science and Remote Sensing III, J. A. Shaw, J. S. Tyo, eds., Proc. SPIE, volume 6682, page 668206, San Diego, CA, Sept. 2007. (Pubitemid 351542043)
    • (2007) Proceedings of SPIE - The International Society for Optical Engineering , vol.6682 , pp. 668206
    • Thilak, V.1    Voelz, D.G.2    Creusere, C.D.3
  • 9
    • 37549057991 scopus 로고    scopus 로고
    • Polarization-based index of refraction and reflection angle estimation for remote sensing applications
    • October
    • V. Thilak, D. G. Voelz, and C. D. Creusere. Polarization-based index of refraction and reflection angle estimation for remote sensing applications. Appl. Opt., 46(30):7527-7536, October 2007.
    • (2007) Appl. Opt. , vol.46 , Issue.30 , pp. 7527-7536
    • Thilak, V.1    Voelz, D.G.2    Creusere, C.D.3
  • 10
    • 0001397551 scopus 로고
    • Theory of off-specular reflection from roughened surfaces
    • September
    • K. E. Torrance and E. M. Sparrow. Theory of off-specular reflection from roughened surfaces. J. Opt. Soc. Am., 57(9):1105-1114, September 1967.
    • (1967) J. Opt. Soc. Am. , vol.57 , Issue.9 , pp. 1105-1114
    • Torrance, K.E.1    Sparrow, E.M.2
  • 11
    • 33749862682 scopus 로고    scopus 로고
    • Review of passive imaging polarimetry for remote sensing applications
    • August
    • J. S. Tyo, D. L. Goldstein, D. B. Chenault, and J. A. Shaw. Review of passive imaging polarimetry for remote sensing applications. Appl. Opt., 45(22):5453-5469, August 2006.
    • (2006) Appl. Opt. , vol.45 , Issue.22 , pp. 5453-5469
    • Tyo, J.S.1    Goldstein, D.L.2    Chenault, D.B.3    Shaw, J.A.4
  • 12
    • 0025521551 scopus 로고
    • A polarization-based material classification from specular reflection
    • November
    • L. B. Wolff. A polarization-based material classification from specular reflection. IEEE Trans. Pattern Anal. Machine Intell., 12:1059-1071, November 1990.
    • (1990) IEEE Trans. Pattern Anal. Machine Intell. , vol.12 , pp. 1059-1071
    • Wolff, L.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.