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Volumn 44, Issue 1, 2011, Pages 213-215

Evaluation of the Bruker SMART X2S: Crystallography for the nonspecialist?

Author keywords

automation; Bruker SMART X2S; instrumentation

Indexed keywords

BRUKER SMART X2S; CHEMICAL CRYSTALLOGRAPHY; DIFFRACTION DATA; ELECTRON DENSITIES; INSTRUMENTATION; STRUCTURE SOLUTIONS;

EID: 79251521480     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810042561     Document Type: Article
Times cited : (37)

References (29)
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    • Adams, P. D. et al. (2010). Acta Cryst. D66, 213-221.
    • (2010) Acta Cryst , vol.D66 , pp. 213-221
    • Adams, P.D.1
  • 7
    • 77949393449 scopus 로고    scopus 로고
    • Bruker AXS Inc., Madison Wisconsin, USA
    • Bruker (2009). APEX2, GIS, SADABS and SAINT. Bruker AXS Inc., Madison, Wisconsin, USA.
    • (2009) APEX2 GIS SADABS and SAINT
  • 20
    • 79251532137 scopus 로고    scopus 로고
    • A Crystallographer's Guide to SHELXL, IUCr Texts on Crystallography Oxford University Press
    • Müller, P. (2007). Crystal Structure Refinement. A Crystallographer's Guide to SHELXL, IUCr Texts on Crystallography 8. Oxford University Press.
    • (2007) Crystal Dtructure Refinement , vol.8
    • Müller, P.1
  • 27
    • 58849161857 scopus 로고    scopus 로고
    • Spek, A. L. (2009). Acta Cryst. D65, 148-155.
    • (2009) Acta Cryst. , vol.D65 , pp. 148-155
    • Spek, A.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.