A comparison of a microfocus X-ray source and a conventional sealed tube for crystal structure determination

Journal of Applied Crystallography

Volumn 42, Issue 5, 2009, Pages 885-891

  Schulz, Thomas ^a   Meindl, Kathrin ^a   Leusser, Dirk ^a   Stern, Daniel ^a   Graf, Jürgen ^b   Michaelsen, Carsten ^b   Ruf, Michael ^c   Sheldrick, George M ^a   Stalke, Dietmar ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b Incoatec GmbH ^*  (Germany)

^c BRUKER AXS INC   (United States)

Author keywords

Crystal structure determination; Microfocus X ray sources

Indexed keywords

EID: 70349305671     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809030921     Document Type: Article

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