λ/2 Contamination in charge-coupled-device area-detector data

Journal of Applied Crystallography

Volumn 30, Issue 4, 1997, Pages 514-516

  Kirschbaum, Kristtn ^a   Martin, Anthony ^a   Pinkerton, A Alan ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000623712     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897004214     Document Type: Article

References (6)

1. Guinier, A. (1963). X-ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies, p. 175. London: W. H. Freeman.
2. International Tables for X-ray Crystallography (1995). Vol. C. Dordrecht: Kluwer Academic Publishers.
3. Rees, B. (1977). Israel J. Chem. 16, 154-158.
4. Sheldrick, G. M. (1986). SHELXTL86. An Integrated System for Solving, Refining and Displaying Crystal Structures from Diffraction Data, University of Gottingen, Germany.
5. Sheldrick, G. M. (1996). SADABS. University of Gottingen, Germany, to be published.
6. Siemens Analytical Instrumentation (1996). SAINT. A Program to Integrate and Reduce Raw Crystallographic Area-Detector Data.