The software package ANAELU for X-ray diffraction analysis using two-dimensional patterns

Journal of Applied Crystallography

Volumn 44, Issue 1, 2011, Pages 241-246

  Fuentes Montero, Luis ^a   Montero Cabrera, Maria Elena ^b   Fuentes Cobas, Luis ^b  

^a INSTITUT LAUE LANGEVIN   (France)

^b CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

ANAELU; area detectors; fibre texture; texture analysis; X ray diffraction modelling

Indexed keywords

ANAELU; APPLICATION CAPABILITY; AREA DETECTORS; AXIALLY SYMMETRIC; DIFFRACTION SIGNALS; FIBRE TEXTURE; INVERSE POLE FIGURES; MEASUREMENT AND ANALYSIS; POLYCRYSTALLINE SAMPLES; TEXTURE ANALYSIS; TWO DIMENSIONAL DIFFRACTION; TWO-DIMENSIONAL PATTERNS;

DIFFRACTION PATTERNS; INTERFEROMETRY; SOFTWARE PACKAGES; TEXTURES; TWO DIMENSIONAL; X RAY DIFFRACTION; X RAYS;

X RAY DIFFRACTION ANALYSIS;

EID: 79251477531     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810048739     Document Type: Article

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