Quantitative Rietveld texture analysis of zirconium from single synchrotron diffraction images

Journal of Applied Crystallography

Volumn 38, Issue 2, 2005, Pages 377-380

  Ischia, Gloria ^a,b   Wenk, Hans Rudolf ^a,c   Lutterotti, Luca ^b   Berberich, Florian ^d  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF TRENTO   (Italy)

^c GFZ GERMAN RESEARCH CENTRE FOR GEOSCIENCES   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ZIRCONIUM;

ARTICLE; COLD; CRYSTALLIZATION; DIFFRACTION; ENERGY; IMAGE ANALYSIS; INFORMATION; SYNCHROTRON; VACUUM; X RAY;

EID: 16844371691     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889805006059     Document Type: Article

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