SCOPUS 정보 검색 플랫폼

Volumn 43, Issue 1-2, 2011, Pages 103-106

Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS

(4) Nittler, L a,b Delcorte, A b Bertrand, P b Migeon, H N a

a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (Luxembourg)

b UNIVERSITÉ CATHOLIQUE DE LOUVAIN (Belgium)

Author keywords

gold; in situ; MetA SIMS; morphology; polycarbonate; polystyrene; ToF SIMS; XPS

Indexed keywords

ARGON ION; DEPOSITED METAL; EVAPORATION FLUX; IN SITU; META-SIMS; METAL-ASSISTED SIMS; METALLIZATIONS; MOLECULAR FILMS; SAMPLE SURFACE; SECONDARY ION YIELD; STICKING COEFFICIENTS; TOF SIMS; XPS; YIELD ENHANCEMENT;

ARGON; GOLD; ION BOMBARDMENT; IONS; MORPHOLOGY; POLYMER BLENDS; POLYMERS; POLYSTYRENES; QUARTZ; SECONDARY ION MASS SPECTROMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

GOLD COATINGS;

EID: 78951490166 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3425 Document Type: Conference Paper

Times cited : (7)

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