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Volumn 43, Issue 1-2, 2011, Pages 498-501

Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters

Author keywords

ionization efficiency; molecular ion; protonated water clusters; soft landing; static SIMS; surface charging

Indexed keywords

IONIZATION EFFICIENCY; MOLECULAR IONS; PROTONATED WATER CLUSTERS; SOFT LANDING; STATIC SIMS; SURFACE CHARGING;

EID: 78951477713     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3161     Document Type: Conference Paper
Times cited : (10)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.