-
1
-
-
0003647734
-
-
American Institute of Physics, New York
-
A. Aviram, Molecular Electronics: Science and Technology (American Institute of Physics, New York, 1992); E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 8, 139 (1996); K. K. Berggren et al., Science 269, 1255 (1995); D. Li et al., J. Am. Chem. Soc. 112, 7389 (1990); A. J. Bard et al., J. Phys. Chem. 97, 7147 (1993).
-
(1992)
Molecular Electronics: Science and Technology
-
-
Aviram, A.1
-
2
-
-
0030085783
-
-
A. Aviram, Molecular Electronics: Science and Technology (American Institute of Physics, New York, 1992); E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 8, 139 (1996); K. K. Berggren et al., Science 269, 1255 (1995); D. Li et al., J. Am. Chem. Soc. 112, 7389 (1990); A. J. Bard et al., J. Phys. Chem. 97, 7147 (1993).
-
(1996)
Adv. Mater.
, vol.8
, pp. 139
-
-
Kim, E.1
Whitesides, G.M.2
Lee, L.K.3
Smith, S.P.4
Prentiss, M.5
-
3
-
-
0029376771
-
-
A. Aviram, Molecular Electronics: Science and Technology (American Institute of Physics, New York, 1992); E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 8, 139 (1996); K. K. Berggren et al., Science 269, 1255 (1995); D. Li et al., J. Am. Chem. Soc. 112, 7389 (1990); A. J. Bard et al., J. Phys. Chem. 97, 7147 (1993).
-
(1995)
Science
, vol.269
, pp. 1255
-
-
Berggren, K.K.1
-
4
-
-
84956171828
-
-
A. Aviram, Molecular Electronics: Science and Technology (American Institute of Physics, New York, 1992); E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 8, 139 (1996); K. K. Berggren et al., Science 269, 1255 (1995); D. Li et al., J. Am. Chem. Soc. 112, 7389 (1990); A. J. Bard et al., J. Phys. Chem. 97, 7147 (1993).
-
(1990)
J. Am. Chem. Soc.
, vol.112
, pp. 7389
-
-
Li, D.1
-
5
-
-
0001239751
-
-
A. Aviram, Molecular Electronics: Science and Technology (American Institute of Physics, New York, 1992); E. Kim, G. M. Whitesides, L. K. Lee, S. P. Smith, M. Prentiss, Adv. Mater. 8, 139 (1996); K. K. Berggren et al., Science 269, 1255 (1995); D. Li et al., J. Am. Chem. Soc. 112, 7389 (1990); A. J. Bard et al., J. Phys. Chem. 97, 7147 (1993).
-
(1993)
J. Phys. Chem.
, vol.97
, pp. 7147
-
-
Bard, A.J.1
-
6
-
-
0029389989
-
-
J. Shi et al., Nature 377, 707 (1995).
-
(1995)
Nature
, vol.377
, pp. 707
-
-
Shi, J.1
-
10
-
-
0001665377
-
-
R. G. Cooks, T. Ast, T. Pradeep, V. H. Wysocki, Acc. Chem. Res. 27, 316 (1994); T. Pradeep et al., J. Am. Soc. Mass Spectrom. 6, 187 (1995).
-
(1994)
Acc. Chem. Res.
, vol.27
, pp. 316
-
-
Cooks, R.G.1
Ast, T.2
Pradeep, T.3
Wysocki, V.H.4
-
11
-
-
0001431911
-
-
R. G. Cooks, T. Ast, T. Pradeep, V. H. Wysocki, Acc. Chem. Res. 27, 316 (1994); T. Pradeep et al., J. Am. Soc. Mass Spectrom. 6, 187 (1995).
-
(1995)
J. Am. Soc. Mass Spectrom.
, vol.6
, pp. 187
-
-
Pradeep, T.1
-
12
-
-
0006163257
-
-
M. D. Porter, T. B. Bright, D. L. Allara, C. E. D. Chidsey, J. Am. Chem. Soc. 109, 3559 (1987); F. Sun et al., ibid. 118, 1856 (1996).
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 3559
-
-
Porter, M.D.1
Bright, T.B.2
Allara, D.L.3
Chidsey, C.E.D.4
-
13
-
-
0029875258
-
-
M. D. Porter, T. B. Bright, D. L. Allara, C. E. D. Chidsey, J. Am. Chem. Soc. 109, 3559 (1987); F. Sun et al., ibid. 118, 1856 (1996).
-
(1996)
J. Am. Chem. Soc.
, vol.118
, pp. 1856
-
-
Sun, F.1
-
14
-
-
0040151076
-
-
For early attempts to perform this experiment, see V. Franchetti, B. H. Solka, W. E. Baitinger, J. W. Amy, R. G. Cooks, Int. J. Mass Spectrom. Ion Phys. 23, 29 (1977).
-
(1977)
Int. J. Mass Spectrom. Ion Phys.
, vol.23
, pp. 29
-
-
Franchetti, V.1
Solka, B.H.2
Baitinger, W.E.3
Amy, J.W.4
Cooks, R.G.5
-
15
-
-
0001620032
-
-
R. G. Cooks, T. Ast, M. A. Mabud, Int. J. Mass Spectrom. Ion Processes 100, 209 (1990); J. L. Jones, A. R. Dongre, A. Somogyi, V. H. Wysocki, J. Am. Chem. Soc. 116, 8368 (1994); Q. Wu and L. Hanley, ibid. 115, 1191 (1993); W. R. Koppers et al., Phys. Rev. B 53, 11207 (1996); M. J. Hayward et al., J. Am. Chem. Soc. 118, 8375 (1996).
-
(1990)
Int. J. Mass Spectrom. Ion Processes
, vol.100
, pp. 209
-
-
Cooks, R.G.1
Ast, T.2
Mabud, M.A.3
-
16
-
-
0001310329
-
-
R. G. Cooks, T. Ast, M. A. Mabud, Int. J. Mass Spectrom. Ion Processes 100, 209 (1990); J. L. Jones, A. R. Dongre, A. Somogyi, V. H. Wysocki, J. Am. Chem. Soc. 116, 8368 (1994); Q. Wu and L. Hanley, ibid. 115, 1191 (1993); W. R. Koppers et al., Phys. Rev. B 53, 11207 (1996); M. J. Hayward et al., J. Am. Chem. Soc. 118, 8375 (1996).
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 8368
-
-
Jones, J.L.1
Dongre, A.R.2
Somogyi, A.3
Wysocki, V.H.4
-
17
-
-
1842266796
-
-
R. G. Cooks, T. Ast, M. A. Mabud, Int. J. Mass Spectrom. Ion Processes 100, 209 (1990); J. L. Jones, A. R. Dongre, A. Somogyi, V. H. Wysocki, J. Am. Chem. Soc. 116, 8368 (1994); Q. Wu and L. Hanley, ibid. 115, 1191 (1993); W. R. Koppers et al., Phys. Rev. B 53, 11207 (1996); M. J. Hayward et al., J. Am. Chem. Soc. 118, 8375 (1996).
-
(1993)
J. Am. Chem. Soc.
, vol.115
, pp. 1191
-
-
Wu, Q.1
Hanley, L.2
-
18
-
-
0001349044
-
-
R. G. Cooks, T. Ast, M. A. Mabud, Int. J. Mass Spectrom. Ion Processes 100, 209 (1990); J. L. Jones, A. R. Dongre, A. Somogyi, V. H. Wysocki, J. Am. Chem. Soc. 116, 8368 (1994); Q. Wu and L. Hanley, ibid. 115, 1191 (1993); W. R. Koppers et al., Phys. Rev. B 53, 11207 (1996); M. J. Hayward et al., J. Am. Chem. Soc. 118, 8375 (1996).
-
(1996)
Phys. Rev. B
, vol.53
, pp. 11207
-
-
Koppers, W.R.1
-
19
-
-
0029840670
-
-
R. G. Cooks, T. Ast, M. A. Mabud, Int. J. Mass Spectrom. Ion Processes 100, 209 (1990); J. L. Jones, A. R. Dongre, A. Somogyi, V. H. Wysocki, J. Am. Chem. Soc. 116, 8368 (1994); Q. Wu and L. Hanley, ibid. 115, 1191 (1993); W. R. Koppers et al., Phys. Rev. B 53, 11207 (1996); M. J. Hayward et al., J. Am. Chem. Soc. 118, 8375 (1996).
-
(1996)
J. Am. Chem. Soc.
, vol.118
, pp. 8375
-
-
Hayward, M.J.1
-
20
-
-
1842306326
-
-
note
-
The image in Fig. 1 was produced with the program CAChe, version 3.7 (CAChe Scientific, Beaverton, OR).
-
-
-
-
21
-
-
36449001164
-
-
F-SAM chain spacings were set according to G. Liu et al., J. Chem. Phys. 101, 4301 (1994).
-
(1994)
J. Chem. Phys.
, vol.101
, pp. 4301
-
-
Liu, G.1
-
22
-
-
1842284374
-
-
note
-
2SH in ethanol for at least a few days. The surfaces were then rinsed and sonicated in ethanol several times before modification by the low-energy ion beams. The substrate consists of a glass layer, 1.6 mm thick, covered with 50 Å of Ti and 1000 Å of polycrystalline gold.
-
-
-
-
23
-
-
1842353489
-
-
note
-
2).
-
-
-
-
24
-
-
1842263855
-
-
note
-
The number of sputtered ions was estimated by converting the total analog-to-digital converter counts in the sputtered ion decay curve of the deposited species into an ion current and estimating corrections for the gain, transmission, and spot sizes of the experiment.
-
-
-
-
25
-
-
1842282405
-
-
note
-
.+ sputtering analysis before the sample was sent to 3M Center (St. Paul, MN) for TOF-SIMS analysis.
-
-
-
-
26
-
-
0004130759
-
-
American Elsevier, New York, ed. 2
-
The cross section for sputtered ion yields is maximized when the recombination energy is in resonance with the ionization energy of the neutral molecule [see J. B. Hasted, Physics of Atomic Collisions (American Elsevier, New York, ed. 2, 1972), p. 612]. Neutralization and deposition of the resulting radicals into the surface is not precluded; this is likely to be one of the ion loss processes leading to low yields.
-
(1972)
Physics of Atomic Collisions
, pp. 612
-
-
Hasted, J.B.1
-
27
-
-
1842274628
-
-
note
-
These experiments were performed with a Finnigan TSQ 700 triple-quadrupole mass spectrometer with the ion source filament turned off. The sample was mounted on a specially constructed direct insertion probe that heated the surface from room temperature to 400°C in 40 s. Well-defined peaks from desorbed ions were observed in plots of ion abundance versus time. The trapped ions that are thermally released might not be as tightly held as those desorbed by ion impact.
-
-
-
-
28
-
-
0029789806
-
-
R. Tellgmann, N. Krawez, S.-H. Lin, I. V. Hertel, E. E. B. Campbell, Nature 382, 407 (1996).
-
(1996)
Nature
, vol.382
, pp. 407
-
-
Tellgmann, R.1
Krawez, N.2
Lin, S.-H.3
Hertel, I.V.4
Campbell, E.E.B.5
-
30
-
-
1842273599
-
-
note
-
Supported by NSF grant CHE-9223791. We thank B. Feng for assistance in the F-SAM surface preparation, D. Lantrip for the CAChe simulations, G. Chen for the triple-quadrupole data, Y. H. Yim for the trifluoromethylbenzoyl data, and T. Bein, W. N. Delgass, B. S. Freiser, H. W. Rohrs, and V. H. Wysocki for helpful comments.
-
-
-
|