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Thin Solid Films

Volumn 519, Issue 7, 2011, Pages 2308-2312

Optical properties of porous anodic aluminum oxide thin films on quartz substrates

(5) Zhuo, Hong a Peng, Fuchuan a Lin, Limei a Qu, Yan a Lai, Fachun a

a FUJIAN NORMAL UNIVERSITY (China)

Author keywords

Anodization; Optical properties; Porous aluminum oxide; Quartz substrate

Indexed keywords

AL REMOVAL; ANODIZATION TIME; ANODIZATIONS; CHEMICAL ETCHING; INTERPORE DISTANCES; NORMAL INCIDENCE; OPTICAL REGIONS; OPTICAL SPECTROPHOTOMETRY; PORE DIAMETERS; PORE WIDENING; POROUS ALUMINUM OXIDE; POROUS ANODIC ALUMINUM OXIDES; QUARTZ SUBSTRATE; WAVELENGTH RANGES;

ALUMINUM; OPTICAL CONSTANTS; OXIDE FILMS; OXIDES; QUARTZ; REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

SUBSTRATES;

EID: 78751650605 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.11.024 Document Type: Article

Times cited : (25)

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