Electrical and testing reliability of CuxO based RRAM

ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings

Volumn , Issue , 2010, Pages 1100-1102

  Wan, Haijun ^a   Tian, Xiaopeng ^a   Song, Yali ^a   Luo, Wenjin ^a   Wang, Ming ^a   Wang, Yanliang ^a   Zhou, Peng ^a   Lin, Yinyin ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAPTURING SYSTEM; COMBINED MODEL; COMPLIANCE CURRENT; DATA RETENTION; ELECTRICAL RELIABILITY; ELECTRICAL TESTING; FAILURE MECHANISM; RELIABILITY PROBLEMS; RESISTIVE RANDOM ACCESS MEMORY; SELF-BUILD; TESTING RELIABILITY; WORK STUDY;

ARCHITECTURE; INTEGRATED CIRCUITS; RANDOM ACCESS STORAGE; RELIABILITY;

ELECTRIC VARIABLES MEASUREMENT;

EID: 78751523088     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSICT.2010.5667559     Document Type: Conference Paper

References (3)

1. H. J. Wan, P. Zhou, Y. Y. Lin, et al., IEEE Electron Device Letters, 31, p.246 (2010).
2. H. J. Wan, P. Zhou, Y. Y. Lin, et al., Journal of Vacuum Science & Technology B, 27, p.2468 (2009).
3. P. Zhou, M. Yin, H. J. Wan, et al., Applied Physics Letters, 94, p.053510 (2009).