Impact of hump effect on MOSFET mismatch in the sub-threshold area for low power analog applications

ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings

Volumn , Issue , 2010, Pages 1817-1819

  Joly, Yohan ^a,b   Lopez, Laurent ^a   Portal, Jean Michel ^b   Aziza, Hassen ^b   Bert, Yannick ^a   Julien, Franck ^a   Fornara, Pascal ^a  

^a STMICROELECTRONICS   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG APPLICATIONS; ANALOG CIRCUIT DESIGN; GATE-SOURCE VOLTAGE; HUMP EFFECT; LOW POWER; MOSFET MISMATCH; PARASITIC TRANSISTORS; SOURCE VOLTAGE; SUBTHRESHOLD;

ANALOG CIRCUITS; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS;

THRESHOLD VOLTAGE;

EID: 78751495342     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSICT.2010.5667684     Document Type: Conference Paper

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