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Volumn 509, Issue 6, 2011, Pages 3116-3121
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Structural, morphological and electrical properties of spray deposited CdIn2Se4 thin films
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Author keywords
Chalcogenides; Chemical synthesis; Electrochemical properties; Transport properties; X ray diffraction
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Indexed keywords
CHEMICAL SYNTHESIS;
COATED GLASS SUBSTRATES;
CUBIC CRYSTAL STRUCTURES;
ELECTRICAL PROPERTY;
ELECTRICAL RESISTIVITY;
ENERGY DISPERSIVE ANALYSIS;
FILM COMPOSITION;
FLUORINE DOPED TIN OXIDE;
OPTIMUM VALUE;
PEC CHARACTERIZATION;
PHOTOELECTROCHEMICALS;
POLYCRYSTALLINE;
PRECURSOR CONCENTRATION;
SOLUTION CONCENTRATION;
SPRAY-DEPOSITED;
SPRAY-PYROLYSIS TECHNIQUES;
THERMOELECTRIC POWER MEASUREMENT;
AMORPHOUS FILMS;
CHALCOGENIDES;
CONCENTRATION (PROCESS);
CRYSTAL STRUCTURE;
CRYSTALLITE SIZE;
DIFFRACTION;
ELECTRIC CONDUCTIVITY;
FLUORINE;
OPEN CIRCUIT VOLTAGE;
OXIDE FILMS;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING SELENIUM COMPOUNDS;
SPRAY PYROLYSIS;
STRUCTURAL ANALYSIS;
STRUCTURAL PROPERTIES;
SUBSTRATES;
SYNTHESIS (CHEMICAL);
THIN FILMS;
TIN;
TIN OXIDES;
TRANSPORT PROPERTIES;
X RAY DIFFRACTION;
X RAYS;
ELECTROCHEMICAL PROPERTIES;
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EID: 78651379621
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.12.013 Document Type: Article |
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Times cited : (8)
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References (29)
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