Characterization of electrodeposited Zn1-xHgxSe thin films

Semiconductor Science and Technology

Volumn 20, Issue 8, 2005, Pages 749-754

  Mahalingam, T ^a,c   Kathalingam, A ^a   Velumani, S ^b   Lee, Soonil ^c   Lew, Kyeung Seek ^c   Deak Kim, Yong ^c  

^a ALAGAPPA UNIVERSITY   (India)

^b INSTITUTO MEXICANO DEL PETRÓLEO   (Mexico)

^c Ajou University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; ELECTRODEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION; ZINC COMPOUNDS;

BATH TEMPERATURE; CRYSTALLINITY; SOLAR SPECTRUM; THIN FILM SYSTEMS;

THIN FILMS;

EID: 22844453230     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/20/8/017     Document Type: Article

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