Structural and optical properties of electrodeposited Cd0.7Zn0.3Se thin films: Effect of annealing

Journal of Alloys and Compounds

Volumn 474, Issue 1-2, 2009, Pages 210-213

  Chavhan, S D ^a   Mane, R S ^b   Ganesh, T ^b   Lee, Wonjoo ^b   Han, Sung Hwan ^b   Senthilarasu, S ^a   Lee, Soo Hyoung ^a  

^a Chonbuk National University   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

Cd0.7Zn0.3Se; Crystalline nature; Electrodeposition; Thin Films

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; ELECTRODEPOSITION; LIGHT ABSORPTION; OPTICAL PROPERTIES; SEMICONDUCTING SELENIUM COMPOUNDS; STRUCTURAL PROPERTIES; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZINC;

AMBIENT AIRS; ANNEALED FILMS; ANNEALING TEMPERATURES; AS-DEPOSITED FILMS; BAND-GAP ENERGIES; CD0.7ZN0.3SE; CRYSTALLINE NATURE; ELECTRODEPOSITION TECHNIQUES; LATTICE PARAMETERS; OPTICAL ABSORPTION SPECTRUM; SEM; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL TRANSITIONS; X-RAY DIFFRACTION TECHNIQUES; XRD PATTERNS; XRD STUDIES; ZINC SELENIDE;

CADMIUM;

EID: 61649088478     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.06.046     Document Type: Article

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