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Volumn , Issue , 2010, Pages

Die-attach for high-temperature applications using fineplacer-pressure- sintering (FPS)

Author keywords

[No Author keywords available]

Indexed keywords

BARE DIES; BOND STRENGTH; COMPOUND LAYER; ELECTRICAL AND MECHANICAL PROPERTIES; ELECTRONIC COMPONENT; FLIP-CHIP BONDERS; GRAIN SIZE; JOINING TECHNIQUES; METALLIZATIONS; MOLYBDENUM SUBSTRATE; NANOMETRES; POSITIONING ACCURACY; PROCESS TEMPERATURE; SILVER POWDERS;

EID: 78651327600     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESTC.2010.5642808     Document Type: Conference Paper
Times cited : (11)

References (14)
  • 1
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    • (1991) Transactions on Industry Applications , vol.21 , Issue.1 , pp. 93-95
    • Schwarzbauer, H.1
  • 2
    • 78651308345 scopus 로고    scopus 로고
    • Packaging and Interconnection Technologies of Power Devices, Challenges and Future Trends
    • Amro, A. A., "Packaging and Interconnection Technologies of Power Devices, Challenges and Future Trends", World Academy of Science, Engineering and Technology, Vol. 49 (2009), pp. 691-694.
    • (2009) World Academy of Science, Engineering and Technology , vol.49 , pp. 691-694
    • Amro, A.A.1
  • 3
    • 78651333393 scopus 로고    scopus 로고
    • Verfahren zur Befestigung von elektronischen Bauelementen auf einem Substrat
    • Patentnummer: DE 10 2004 056 702 B3
    • Palm, G., "Verfahren zur Befestigung von elektronischen Bauelementen auf einem Substrat", Patentnummer: DE 10 2004 056 702 B3 (2006).
    • (2006)
    • Palm, G.1
  • 4
    • 33750841291 scopus 로고    scopus 로고
    • Thermomechanical Reliability of Low-Temperature Sintered Silver Die Attached SiC Power Device Assembly
    • Bai, J. G., et al., "Thermomechanical Reliability of Low-Temperature Sintered Silver Die Attached SiC Power Device Assembly", IEEE Transactions on Device and Materials Reliability, Vol. 6, No. 3 (2006), pp. 436-441.
    • (2006) IEEE Transactions on Device and Materials Reliability , vol.6 , Issue.3 , pp. 436-441
    • Bai, J.G.1
  • 5
    • 77949570891 scopus 로고    scopus 로고
    • Silver Joints between Silicon Chips and Copper Substrates Made by Direct Bonding at Low-Temperature
    • Wang, P. J. et al., "Silver Joints between Silicon Chips and Copper Substrates Made by Direct Bonding at Low-Temperature", IEEE Transactions on Components and Packaging Technologies, Vol. 33, No. 1 (2010)
    • (2010) IEEE Transactions on Components and Packaging Technologies , vol.33 , Issue.1
    • Wang, P.J.1
  • 6
    • 14844322881 scopus 로고    scopus 로고
    • A Lead-Free, Low-Temperature Sintering Die-Attach Technique for High Performance and High-Temperature Packaging
    • Lu, G.-Q. et al., "A Lead-Free, Low-Temperature Sintering Die-Attach Technique for High Performance and High-Temperature Packaging", Proceeding of HDP (2004), pp. 42-46.
    • Proceeding of HDP (2004) , pp. 42-46
    • Lu, G.-Q.1
  • 8
    • 78651342130 scopus 로고    scopus 로고
    • Chip-Substrat-Kontaktierung opto-elektronischer Bauelemente mittels Fineplacer-Verbindungstechnik
    • VDE Berlin
    • Kähler, J. et al., "Chip-Substrat-Kontaktierung opto-elektronischer Bauelemente mittels Fineplacer-Verbindungstechnik", GMM-FB 63: Beiträge des 2. GMM-Workshops 3,/4. März 2010 in Erfurt, VDE (Berlin, 2010), pp. 9-13.
    • (2010) GMM-FB 63: Beiträge des 2. GMM-Workshops 3,/4. März 2010 in Erfurt , pp. 9-13
    • Kähler, J.1
  • 10
    • 84864612987 scopus 로고    scopus 로고
    • Swelling Phenomena in Sintered Silver Die Attach Structures at High Temperatures: Reliability Problems and Solutions for an Operation above 350°C
    • Heuck, N. et al., "Swelling Phenomena in Sintered Silver Die Attach Structures at High Temperatures: Reliability Problems and Solutions for an Operation above 350°C", iMAPs Proceeding of HiTEC 2010.
    • iMAPs Proceeding of HiTEC 2010
    • Heuck, N.1
  • 11
    • 0026999330 scopus 로고
    • Plastic Yield Behaviour of Porous Metals
    • Lee, D. N. et al., "Plastic Yield Behaviour of Porous Metals", Powder Metallurgy, Vol. 35, No. 4 (1992), pp. 275-279.
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  • 13
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    • On the Relationship between the Properties and the Microstructure of Multiphase Materials. Part III: Microstructure and Young's Modulus of Elasticity
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    • Ondracek, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.