Novel low loss, low permittivity glass-ceramic composites for LTCC applications

International Journal of Applied Ceramic Technology

Volumn 8, Issue 1, 2011, Pages 172-179

  George, Sumesh ^a   Sebastian, Mailadil Thomas ^a   Raman, Sujith ^b   Mohanan, Pezholil ^b  

^a REGIONAL RESEARCH LABORATORY CSIR   (India)

^b Department of Physics   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CAVITY PERTURBATION TECHNIQUE; GLASS CERAMIC COMPOSITES; LOW LOSS; LOW TEMPERATURES; LOW-TEMPERATURE CO-FIRED CERAMICS; MICROWAVE DIELECTRIC PROPERTIES; PARALLEL PLATE CAPACITORS; RADIO FREQUENCIES; SINTERING TEMPERATURES; SOLID-STATE CERAMICS;

BOROSILICATE GLASS; CALCINATION; CERAMIC MATERIALS; PERMITTIVITY; PERTURBATION TECHNIQUES; POWDER METALLURGY; SECONDARY BATTERIES; SINTERING;

DIELECTRIC MATERIALS;

EID: 78651101128     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2009.02423.x     Document Type: Article

References (30)

1. K. Maex, M. R. Baklanov, D. Shamiryan, F. Lacopi, S. H. Brongersma, and, Z. S. Yanovitskaya, " Low Dielectric Constant Materials for Microelectronics," J. Appl. Phys., 93 8794-8841 (2003).
2. M. T. Sebastian, Dielectric Materials for Wireless Communication, Elsevier publications, UK, 2008.
3. D. L. Chung, Materials for Electronic Packaging, Butterworth-Heinemann, Boston, 19-27, 1995.
4. 8 (x=0 and 2) Ceramics," J. Eur. Ceram. Soc., 25 2835-2838 (2005).
5. R. R. Thummala, " Ceramic and Glass-Ceramic Packaging in the 1990s," J. Am. Ceram. Soc., 74 [5] 895-908 (1991).
6. H. Ohsato, T. Tsunooka, T. Sugiyama, K.-I. Kakimoto, and, H. Ogawa, " Forsterite Ceramics for Millimeterwave Dielectrics," J. Electroceram., 17 445-450 (2006).
7. 2-Doped Willemite Ceramics at Millimeter-Wave Frequency," J. Eur. Ceram. Soc., 26 1827-1830 (2006).
8. 7 Ceramic for Substrate Applications," J. Appl. Ceram. Tech., 6 286-294 (2009).
9. 3: A Low Permittivity Microwave Dielectric Ceramic System," Mater. Sci. Eng. B., 138 46-50 (2007).
10. M. Terada, K. Kawamura, I. Kagomiya, K. Kakimoto, and, H. Ohsato, " Effect of Ni Substitution on the Microwave Dielectric Properties of Cordierite," J. Eur. Ceram. Soc., 27 3045-3048 (2007).
11. T. Okamura, and, T. Kishino, " Dielectric Properties of Rare-Earth-Added Cordierite at Microwave and Millimeter Wave Frequencies," Jpn. J. Appl. Phys., 37 5364-5366 (1998).
12. S. J. Penn, N. Mc.Alford, A. Templeton, X. Wang, M. Xu, M. Reece, and, K. Schrapel, " Effect of Porosity and Grain Size on the Microwave Dielectric Properties of Sintered Alumina," J. Am. Ceram. Soc., 80 [7] 1885-1888 (1997).
13. 2 System for Microwave Substrate Applications," Eur. Phys. J. B, 41 301-306 (2004).
14. 2 System for Microelectronic Applications," J. Appl. Phys., 98 044101-044105 (2005).
15. S Cho, I Kim, and, K. S. Hong, " Microwave Dielectric Properties and Applications of Rare-Earth Aluminates," J. Mater. Res., 14 114-119 (1999).
16. Q Zhang, H. Yang, and, H. P. Sun, " A New Microwave Ceramic with Low-Permittivity for LTCC Applications," J. Eur. Ceram. Soc., 28 605-609 (2008).
17. 4 Ceramic for LTCC Based Devices," J. Am. Ceram. Soc., 92 1244-1249 (2008).
18. M. T. Sebastian, and, H. Jantunen, " Low Loss Dielectric Materials for LTCC Applications: A Review," Int. Mater. Rev., 53 57-90 2008.
19. 3-δ Ceramics for LTCC Applications," J. Alloys Compd., 473 336-340 (2009).
20. 4," J. Solid State Chem., 7 422-427 (1973).
21. J. Liu, J. Sun, and, C. Shi, " A New Luminescent Material: Li2CaSiO4:Eu2," Mater. Lett., 60 2830-2833 (2006).
22. 4 Crystal: Growth and Spectroscopic Properties," Opt. Commun., 231 273-280 (2004).
23. H. Jantunen, "A Novel Low Temperature Cofiring Ceramic (LTCC) Material for Telecommunication Devices," Ph.D. Thesis, University of Oulu, Finland, 2001.
24. J.-M. Wu, and, H.-L. Huang, " Microwave Properties of Zinc, Barium and Lead Borosilicate Glasses," J. Non Cryst. Solids, 260 116-124 (1999).
25. J. H. Park, Y.-J. Choi, and, J.-H. Park, " Low Fire Dielectric Compositions with Permittivity 20-60 for LTCC Applications," Mater. Chem. Phys., 88 308-312 (2004).
26. 2," Mater. Res. Bull., 43 843-851 (2008).
27. L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and, V. K. Varadan, Microwave Electronics: Measurement and Materials Characterization, John Wiley & Sons, Cambridge, U.K., 2004 p. 256.
28. A. Prakash, J. K. Vaid, and, A. Mansingh, " Measurement of Dielectric Parameters at Microwave Frequencies by Cavity Perturbation Technique," IEEE Trans. Microwave Theory. Technol., 27 791-795 (1979).
29. 12 Ceramics," Mater. Sci. Eng. B, 123 31-40 (2005).
30. I.-C. Ho, " Semiconducting Barium Titanate Ceramics Prepared by Boron-Containing Liquid-Phase Sintering," J. Am. Ceram. Soc., 77 [3] 829-832 (1994).