Temperature stable low loss ceramic dielectrics in (1-x)ZnAl 2O4-xTiO2 system for microwave substrate applications

European Physical Journal B

Volumn 41, Issue 3, 2004, Pages 301-306

  Surendran, K P ^a   Santha, N ^a   Mohanan, P ^b   Sebastian, M T ^a  

^a REGIONAL RESEARCH LABORATORY CSIR   (India)

^b Department of Physics   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BALL MILLING; CRYSTAL STRUCTURE; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRIC INSULATORS; MICROWAVES; NATURAL FREQUENCIES; POROSITY; THERMODYNAMIC STABILITY; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

MICROWAVE DIELECTRIC PROPERTIES; MOLE FRACTIONS; NIOBATES; PHASE PURITY; PZT CERAMICS; TANTALATES; TITANATES;

CERAMIC MATERIALS;

EID: 10044226292     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjb/e2004-00321-8     Document Type: Article

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