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Volumn 59, Issue 3, 2011, Pages 1184-1190

Nanosized induced low-temperature alloying in binary and ternary noble alloy systems for micro-interconnect applications

Author keywords

Auger electron microscopy; Depth profiling; Low temperature alloying; Nanoindentation; Nanoparticle deposit

Indexed keywords

AUGER ELECTRON MICROSCOPY; BULK STATE; BULK SUBSTRATES; INTERCONNECT APPLICATIONS; LOW TEMPERATURES; METALLIC NANOPARTICLES; NANO-SIZED; NANOSIZE EFFECTS; NOBLE ALLOYS; NONEQUILIBRIUM CONDITIONS; SUPERCOOLED LIQUIDS; TERNARY ALLOYING;

EID: 78650708684     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.10.051     Document Type: Article
Times cited : (16)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.