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Volumn 59, Issue 3, 2011, Pages 1184-1190
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Nanosized induced low-temperature alloying in binary and ternary noble alloy systems for micro-interconnect applications
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Author keywords
Auger electron microscopy; Depth profiling; Low temperature alloying; Nanoindentation; Nanoparticle deposit
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Indexed keywords
AUGER ELECTRON MICROSCOPY;
BULK STATE;
BULK SUBSTRATES;
INTERCONNECT APPLICATIONS;
LOW TEMPERATURES;
METALLIC NANOPARTICLES;
NANO-SIZED;
NANOSIZE EFFECTS;
NOBLE ALLOYS;
NONEQUILIBRIUM CONDITIONS;
SUPERCOOLED LIQUIDS;
TERNARY ALLOYING;
ALLOYING;
AUGER ELECTRON SPECTROSCOPY;
AUGERS;
DEPOSITS;
DEPTH PROFILING;
HEATING;
NANOINDENTATION;
NANOPARTICLES;
SILVER;
SILVER ALLOYS;
SUBSTRATES;
SUPERCOOLING;
GOLD;
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EID: 78650708684
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2010.10.051 Document Type: Article |
Times cited : (16)
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References (25)
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