Interdiffusion and reaction of metals: The influence and relaxation of mismatch-induced stress

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 24, 2001, Pages

  Hartung, F ^a   Schmitz, G ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; GOLD; SILVER;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL REACTION; CRYSTALLIZATION; DIFFUSION; ELECTRON MICROSCOPY; REACTION ANALYSIS;

EID: 4243599411     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.245418     Document Type: Article

References (48)

1. J W. Cahn and J E. Hilliard, J. Chem. Phys.28, 1085 (1958).
2. H E. Cook and J E. Hilliard, J. Appl. Phys.40, 2191 (1969).
3. F C. Larché and J W. Cahn, Acta Metall.30, 1835 (1982).
4. F C. Larché and J W. Cahn, Acta Metall.33, 331 (1985).
5. G B. Stephenson, Acta Metall.36, 2663 (1988).
6. A L. Greer, Defect Diffus. Forum129-130, 163 (1996).
7. H. Mehrer, in Diffusion in Solid Metals and Alloys, edited by D. Madelung, Landoldt Börnstein, New Series, Group III, Vol. 26, pt. 81 (Springer, Verlag, Berlin, 1990).
8. Victawet delivered by PLANO.
9. A. Romano, J. Vanhellemont, H. Bender, and J R. Morante, Ultramicroscopy31, 183 (1989).
10. M M J. Treacy and J M. Gibson, Ultramicroscopy52, 31 (1993).
11. G. Schmitz, J. Ewert, and F. Hartung, Ultramicroscopy77, 49 (1999).
12. P. Haasen, Physical Metallurgy (Cambridge University Press, Cambridge, England, 1996), p. 123.
13. F. Hartung, Ph.D. thesis, University of Göttingen, 2000.
14. J E. Marcur and R W. Vook, Thin Solid Films66, 371 (1980).
15. J H. van der Merwe, J. Appl. Phys.34, 123 (1963).
16. P. Pirouz, F. Ernst, and Y. Ikuhara, Solid State Phenom.59-60, 51 (1998).
17. G. Gladyszewski, Thin Solid Films204, 473 (1991).
18. T. Jeske and G. Schmitz, Mater. Sci. Eng. (to be published).
19. J. Schleiwies and G. Schmitz, Mater. Sci. Eng. (to be published).
20. C. Lang, G. Schmitz, and R. KirchheimDefect Diffus. Forum194-199, 1525 (2001).
21. W A. Johnson, Trans. AIME147, 331 (1942).
22. H E. Cook and J E. Hilliard, J. Appl. Phys.40, 2191 (1969).
23. K. Meinel, M. Klaua, and H. Bethge, Thin Solid Films34, 157 (1976).
24. S K. Wonnel, J M. Delaye, M. Bibole, and Y. Limoge, J. Appl. Phys.72, 5195 (1992).
25. F.-L. Yang, A L. Greer, and R E. Somekh, Thin Solid Films275, 258 (1996).
26. J C. Ewert, F. Hartung, and G. Schmitz, Appl. Phys. Lett.71, 1311 (1997).
27. P A. Stadelmann, Ultramicroscopy21, 131 (1987).
28. W D. Nix, Metall. Trans. A20, 2217 (1989).
29. G. Simmons and H. Wang, Single Crystal Elastic Constants and Calculated Aggregate Properties (Cambridge University Press, Cambridge, England, 1971).
30. J. Weertman and J R. Weertman, in Physical Metallurgy, edited by R. Cahn and P. Haasen (North-Holland, Amsterdam, 1983), p. 1305.
31. W B. Pearson, A Handbook of Lattice Spacing and Structures of Metals and Alloys (Pergamon Press, London, 1967), Vol. II.
32. J P. Hirth and J. Lothe, Theory of Dislocations (McGraw-Hill, New York, 1982).
33. D N. Yoon, Annu. Rev. Mater. Sci.19, 43 (1989).
34. H E. Kissinger, Anal. Chem.29, 1702 (1957).
35. S. Fujikawa, M. Werner, H. Mehrer, and A. Seeger, Mater. Sci. Forum15-18, 431 (1987).
36. C T. Tomizuka, Bull. Am. Phys. Soc.2, 123 (1957).
37. A E. Austin, N A. Richard, and E. Wood, J. Appl. Phys.37, 3651 (1966).
38. A. Chatterjee and D J. Fabian, Acta Metall.17, 1141 (1969).
39. K N. Tu, J. Appl. Phys.48, 3400 (1977).
40. V M. Kosevich, A N. Gladkikh, M V. Karpowsky, and V N. Klimenko, Int. J. Neural Syst.2, 247 (1994);
41. Int. J. Neural Syst.V M. KosevichA N. GladkikhM V. KarpowskyV N. Klimenko2, 261 (1994);
42. Int. J. Neural Syst.V M. KosevichA N. GladkikhM V. KarpowskyV N. Klimenko2, 271 (1994);
43. V M. Kosevich, V N. Klimenko, A N. Gladkikh, and M V. Karpowsky, Int. J. Neural Syst.3, 151 (1995).
44. F J A. den Broeder, M. Klerk, J M. Vandenberg, and R A. Hamm, Acta Metall.31, 285 (1983).
45. J W. Cahn, J D. Pan, and R W. Balluffi, Scr. Metall.13, 503 (1979).
46. B. Sundmann, S G. Fries, and W A. Oates, Z. Metallkd.90, 4 (1999).
47. K N. Tu and B S. Berry, J. Appl. Phys.43, 3283 (1972).
48. J A. Borders, Thin Solid Films19, 359 (1973).