Electromechanical robustness of monolayer graphene with extreme bending

Applied Physics Letters

Volumn 97, Issue 22, 2010, Pages

  Briggs, Benjamin D ^a   Nagabhirava, Bhaskar ^a   Rao, Gayathri ^a   Geer, Robert ^a   Gao, Haiyuan ^b   Xu, Yang ^b   Yu, Bin ^a  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND MODIFICATIONS; BENDING ANGLE; CARBON NANOSTRUCTURES; CURVATURE RADII; DEFORMATION PARAMETER; ELECTRONIC TRANSPORT MEASUREMENTS; EXTREME CONDITIONS; MECHANICAL ROBUSTNESS; TIGHT BINDING; UNIAXIAL BENDING;

CARRIER MOBILITY; GRAPHENE; MONOLAYERS; RAMAN SPECTROSCOPY;

BENDING (DEFORMATION);

EID: 78650669623     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3519982     Document Type: Article

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