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ECS Transactions

Volumn 28, Issue 5, 2010, Pages 39-44

Bilayer graphene system: Transport and reliability

(5) Yu, T a Lee, E a Briggs, B a Nagabhirava, B a Yu, B a

a STATE UNIVERSITY OF NEW YORK (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO;

BILAYER GRAPHENE; BREAKDOWN CHARACTERISTICS; BREAKDOWN CURRENTS; BREAKDOWN MECHANISM; CONTACT STRUCTURE; CURRENT-STRESSING; LINEAR DEPENDENCE; THERMAL-ANNEALING;

GRAPHENE;

EID: 78650480887 PISSN: 19385862 EISSN: 19386737 Source Type: Conference Proceeding
DOI: 10.1149/1.3367934 Document Type: Conference Paper

Times cited : (4)

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