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Volumn 97, Issue 24, 2010, Pages

Quantum dot-cavity strong-coupling regime measured through coherent reflection spectroscopy in a very high-Q micropillar

(7) Loo, Vivien a Lanco, Loïc a,b Lemàtre, Aristide a Sagnes, Isabelle a Krebs, Olivier a Voisin, Paul a Senellart, Pascale a

a CNRS (France)

b UNIVERSITÉ PARIS DESCARTES (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE REFLECTIVITY; COUPLING STRENGTHS; EXCITATION POWER; FACTOR OF MERITS; HIGH QUALITY FACTORS; MICRO PILLARS; QUANTUM DOT; REFLECTION SPECTROSCOPY; SPECTRAL WIDTHS; STRONG COUPLING; STRONG-COUPLING REGIME;

ELECTROMAGNETIC WAVE REFLECTION; SEMICONDUCTOR QUANTUM DOTS;

QUANTUM THEORY;

EID: 78650395451 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3527930 Document Type: Article

Times cited : (76)

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