Effect of annealing on the surface and band gap alignment of CdZnS thin films

Applied Surface Science

Volumn 257, Issue 6, 2011, Pages 1923-1927

  Kumar, T Prem ^a,b   Saravanakumar, S ^a   Sankaranarayanan, K ^b  

^a SYED AMMAL ENGINEERING COLLEGE   (India)

^b ALAGAPPA UNIVERSITY   (India)

Author keywords

Atomic force microscopy; Band gap; CdZnS thin films; Surface properties; X ray diffraction

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; CADMIUM SULFIDE; ENERGY GAP; II-VI SEMICONDUCTORS; SULFUR COMPOUNDS; SURFACE PROPERTIES; SURFACE ROUGHNESS; X RAY DIFFRACTION; ZINC SULFIDE;

ABSORBANCE MEASUREMENTS; ANNEALING TEMPERATURES; CDZNS THIN FILMS; EFFECT OF ANNEALING; HEXAGONAL STRUCTURES; POLYCRYSTALLINE; ROOT MEAN SQUARE; VISIBLE RANGE;

THIN FILMS;

EID: 78650300900     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.09.027     Document Type: Article

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