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Microelectronic Engineering

Volumn 51, Issue , 2000, Pages 703-713

AFM and SEM studies of CdS thin films produced by an ultrasonic spray pyrolysis method

(2) Baykul, M C a Balcioglu, A b

a ESKISEHIR OSMANGAZI UNIVERSITY (Turkey)

b Department of Geology and Geological Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY GAP; GRAIN SIZE AND SHAPE; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING GLASS; SURFACE STRUCTURE;

CADMIUM SULFIDE; PROZA CORRECTION METHOD; ULTRASONIC SPRAY PYROLYSIS;

THIN FILMS;

EID: 0033713824 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/S0167-9317(99)00534-1 Document Type: Article

Times cited : (47)

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