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Volumn 74, Issue 2, 2002, Pages 205-211
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Structure, refractive-index dispersion and the optical absorption edge of chemically deposited ZnxCd(1-x)S thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTAL STRUCTURE;
ELECTRON DIFFRACTION;
ENERGY GAP;
LIGHT ABSORPTION;
OSCILLATIONS;
PERMITTIVITY;
REFRACTIVE INDEX;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
CHEMICAL BATH DEPOSITION;
VOLUME ENERGY LOSS FUNCTIONS;
ZINC CADMIUM SULFIDE;
SEMICONDUCTING ZINC COMPOUNDS;
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EID: 0036477612
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s003390100877 Document Type: Article |
Times cited : (66)
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References (22)
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