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Volumn 74, Issue 2, 2002, Pages 205-211

Structure, refractive-index dispersion and the optical absorption edge of chemically deposited ZnxCd(1-x)S thin films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ENERGY GAP; LIGHT ABSORPTION; OSCILLATIONS; PERMITTIVITY; REFRACTIVE INDEX; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0036477612     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390100877     Document Type: Article
Times cited : (66)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.