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Volumn 415, Issue 1 SUPPL, 2011, Pages
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Surface chemistry of first wall materials - From fundamental data to modeling
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL ANALYSIS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SURFACE ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHEMICAL SURFACES;
FIRST WALL MATERIALS;
LABORATORY EXPERIMENTS;
QUANTITATIVE DESCRIPTION;
REACTION MECHANISM;
RUTHERFORD BACKSCATTERING ANALYSIS;
SURFACE REACTION MODELS;
SURFACE TEMPERATURES;
SURFACE REACTIONS;
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EID: 78650210370
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnucmat.2010.08.056 Document Type: Conference Paper |
Times cited : (20)
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References (43)
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