Measurement of beryllium depth profiles in carbon

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 219-220, Issue 1-4, 2004, Pages 947-952

  Schmid, K ^a   Wiltner, A ^a   Linsmeier, Ch ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DIFFUSION; IMPURITIES; INTERFACES (MATERIALS); MONTE CARLO METHODS; OXYGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SENSITIVITY ANALYSIS; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

FUSION DEVICES; SCATTERING ANGLES;

BERYLLIUM;

EID: 2442602124     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.194     Document Type: Conference Paper

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