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Volumn 219-220, Issue 1-4, 2004, Pages 947-952

Measurement of beryllium depth profiles in carbon

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; DIFFUSION; IMPURITIES; INTERFACES (MATERIALS); MONTE CARLO METHODS; OXYGEN; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SENSITIVITY ANALYSIS; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 2442602124     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.194     Document Type: Conference Paper
Times cited : (14)

References (8)
  • 6
    • 0004077682 scopus 로고    scopus 로고
    • Report IPP 9/113, Max-Planck-Institut für Plasmaphysik, Garching, Germany
    • M. Mayer, SIMNRA User's Guide, Report IPP 9/113, Max-Planck-Institut für Plasmaphysik, Garching, Germany, 1997.
    • (1997) SIMNRA User's Guide
    • Mayer, M.1
  • 7
    • 2442477174 scopus 로고    scopus 로고
    • matej.mayer@ipp.mpg.de
    • www.rzg.mpg.de/~mam/ , matej.mayer@ipp.mpg.de.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.