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Volumn 219-220, Issue 1-4, 2004, Pages 947-952
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Measurement of beryllium depth profiles in carbon
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
DIFFUSION;
IMPURITIES;
INTERFACES (MATERIALS);
MONTE CARLO METHODS;
OXYGEN;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SENSITIVITY ANALYSIS;
SURFACE STRUCTURE;
X RAY PHOTOELECTRON SPECTROSCOPY;
FUSION DEVICES;
SCATTERING ANGLES;
BERYLLIUM;
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EID: 2442602124
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.01.194 Document Type: Conference Paper |
Times cited : (14)
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References (8)
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