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Volumn 37, Issue 2, 1997, Pages 307-315
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Chemical compound formation and its analysis in the beryllium-carbon binary system at elevated temperatures
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Author keywords
Beryllium; Carbon; Plasma facing materials; Secondary ion mass spectroscopy; Thermal desorption spectroscopy; X Ray diffractometry; X Ray photoelectron spectroscopy
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Indexed keywords
BINARY MIXTURES;
CARBON;
SECONDARY ION MASS SPECTROMETRY;
THERMAL EFFECTS;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
PLASMA FACING MATERIALS;
BERYLLIUM;
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EID: 0031221333
PISSN: 09203796
EISSN: None
Source Type: Journal
DOI: 10.1016/S0920-3796(97)00055-0 Document Type: Article |
Times cited : (13)
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References (15)
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