Time-of-flight static secondary ion mass spectrometry analysis of surface contamination on Pt/Ir standard mass material

Rapid Communications in Mass Spectrometry

Volumn 12, Issue 18, 1998, Pages 1261-1265

  Chakraborty, Bibhash R ^a,b   Lehman, Daniel E ^a   Winograd, Nicholas ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CATALYST ACTIVITY; CLEANING; HYDROCARBONS; PLATINUM ALLOYS; SECONDARY ION MASS SPECTROMETRY;

CLEANING PROCEDURES; MASS SPECTROMETRY ANALYSIS; MASS STANDARD; OXYGENATED HYDROCARBON; STANDARD MASS; STATIC TIME; SURFACE CONTAMINANTS; SURFACE CONTAMINATIONS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TIME OF FLIGHT STATIC SECONDARY ION MASS SPECTROMETRY;

SECONDARY EMISSION;

EID: 0031662448     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-0231(19980930)12:18<1261::aid-rcm322>3.0.co;2-%23     Document Type: Article

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