The use of X-ray photoelectron spectroscopy to estimate the stability of primary mass standards

Measurement: Journal of the International Measurement Confederation

Volumn 40, Issue 7-8, 2007, Pages 762-768

  Davidson, Stuart ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Mass standard; Surface study; Weighing

Indexed keywords

MASS TRANSFER; PARAMETER ESTIMATION; STAINLESS STEEL; SURFACE ANALYSIS; WEIGHING;

MASS STANDARD; OVERLAYER THICKNESS; STANDARD MASSES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34548102746     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2006.08.002     Document Type: Article

References (2)

1. Hill J., et al. Chem. Phys. Lett. 44 (1976) 225
2. P. Cumpson, NPL Report CMMT(D) 178, 1998.