Failure analysis of module design qualification testing - III: 1997-2005 vs. 2005-2007 vs. 2007-2009

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 251-255

  TamizhMani, G ^a   Li, B ^a   Arends, T ^a   Kuitche, J ^a   Raghuraman, B ^a   Shisler, W ^a   Farnsworth, K ^a   Voropayev, A ^a   Parker, D ^a  

^a T V Rheinland Industrie Service GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED STRESS; INSULATION FAILURES; MODULE DESIGN; OVERALL FAILURE; PERFORMANCE FAILURE; PHOTOVOLTAIC MODULES; POWER DROPS; QUALIFICATION TESTING; SAFETY ISSUES; TESTING LABORATORIES; WET RESISTANCE;

LABORATORIES; PHOTOVOLTAIC EFFECTS; QUALITY ASSURANCE; SAFETY TESTING;

FAILURE ANALYSIS;

EID: 78650152365     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5614459     Document Type: Conference Paper

References (6)

1. IEC 61215, Crystalline Silicon terrestrial photovoltaic (PV) modules- design qualification and type approval, 2005.
2. IEC 61646, Thin-film terrestrial photovoltaic (PV) modules - Design qualification and type approval, 2008.
3. IEEE 1262, Recommended Practice for Qualification of Photovoltaic (PV) Modules, 1995.
4. C. Osterwald and T. McMohan: History of Accelerated and Qualification Testing of Terrestrial Photovoltaic Modules: A Literature Review, Progress in Photovoltaics, 17, 11-33, 2008.
5. st European PVSC, Dresden, Germany, September 2006.
6. rd IEEE Photovoltaic Specialists Conference, San Diego, California, May, 2008.