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Journal of Vacuum Science and Technology B

Volumn 28, Issue 6, 2010, Pages 1120-1124

Complex dielectric function and refractive index spectra of epitaxial CdO thin film grown on r -plane sapphire from 0.74 to 6.45 eV

(6) Choi, S G a Zuniga Perez J b,c Munoz Sanjose V b Norman, A G a Perkins, C L a Levi, D H a

a NATIONAL RENEWABLE ENERGY LABORATORY (United States)

b UNIVERSITY OF VALENCIA (Spain)

c CRHEA CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; EPITAXIAL GROWTH; FILM PREPARATION; INTERPOLATION; ORGANOMETALLICS; SAPPHIRE; SURFACE TREATMENT; THIN FILMS;

CDO THIN FILMS; COMPLEX DIELECTRIC FUNCTIONS; ELLIPSOMETRIC DATA; METAL-ORGANIC VAPOUR PHASE EPITAXY; PLANE SAPPHIRE; REFRACTIVE-INDEX SPECTRUM; SAPPHIRE SUBSTRATES; SPECTRA'S; SURFACE OVERLAYERS; THIN-FILMS;

REFRACTIVE INDEX;

EID: 78650119682 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3498755 Document Type: Article

Times cited : (22)

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