Plasmonic light trapping for thin film A-SI:H solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 760-765

  Ferry, Vivian E ^a,b   Verschuuren, Marc A ^c   Li, Hongbo B T ^d   Verhagen, Ewold ^a   Walters, Robert J ^a   Schropp, Ruud E I ^d   Atwater, Harry A ^b   Polman, Albert ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

^d UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

A-SI:H; BACK CONTACT; BACK REFLECTORS; ELECTROMAGNETIC MODELING; LIGHT-TRAPPING; NANO-IMPRINT; OVERALL EFFICIENCY; PERIODIC PATTERN; PHOTOCURRENT MEASUREMENT; PLASMONIC; WAVEGUIDE MODE;

PHOTOVOLTAIC EFFECTS; SEMICONDUCTOR QUANTUM WELLS; SOLAR CELLS; SWITCHING CIRCUITS; ULTRATHIN FILMS;

PLASMONS;

EID: 78650094627     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5617101     Document Type: Conference Paper

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