Bridging, non-bridging and free (O2-) oxygen in Na 2O-SiO2 glasses: An X-ray Photoelectron Spectroscopic (XPS) and Nuclear Magnetic Resonance (NMR) study

Journal of Non-Crystalline Solids

Volumn 357, Issue 1, 2011, Pages 170-180

  Nesbitt, H W ^a   Bancroft, G M ^a   Henderson, G S ^b   Ho, R ^a   Dalby, K N ^a   Huang, Y ^a   Yan, Z ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

Nuclear Magnetic Resonance N220; Sodium silicate glasses S265; XPS X110

Indexed keywords

BRIDGING OXYGEN; CHARGE COMPENSATION; COMPOSITIONAL RANGE; CORE LEVELS; HIGH RESOLUTION; MAS NMR; METASILICATE; NON-BRIDGING OXYGEN; OXYGEN SPECIES; SI ATOMS; SILICATE GLASS; SMALL CONCENTRATION; SODIUM SILICATE GLASSES S265; SPECIES ABUNDANCE; X RAY BEAM; X-RAY PHOTOELECTRONS; XPS; XPS SPECTRA; XPS X110;

GLASS; OXYGEN; RESONANCE; SILICATES; SILICON; SODIUM; SOLVENTS; X RAY PHOTOELECTRON SPECTROSCOPY;

NUCLEAR MAGNETIC RESONANCE;

EID: 78649759136     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2010.09.031     Document Type: Article

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