SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 31, Issue 5, 2001, Pages 369-374

Surface modification of a silicate glass during XPS experiments

(3) Sharma, A a Jain, H a Miller, A C b

a Lehigh University (United States)

b LEHIGH UNIVERSITY (United States)

Author keywords

Glass; Radiation effect; Sodium ion diffusion; X rays; XPS

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; DIFFUSION IN GASES; ELECTRON TRAPS; IONIC CONDUCTION; RADIATION EFFECTS; SODIUM COMPOUNDS; SURFACE CHEMISTRY; SURFACE TREATMENT; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

LOW ENERGY ELECTRONS; SODA LIME;

FUSED SILICA;

EID: 0035332260 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.983 Document Type: Article

Times cited : (57)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.