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Volumn 85, Issue 10, 2007, Pages 782-792

High resolution O 1s XPS spectral, NMR, and thermodynamic evidence bearing on anionic silicate moieties (units) in PbO-SiO2 and Na 2O-SiO2 glasses

Author keywords

High resolution; NMR; Silicate glass; XPS

Indexed keywords

BINDING ENERGY; ELECTRONIC STRUCTURE; EXCITED STATES; NEGATIVE IONS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; VISCOSITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 36148977209     PISSN: 00084042     EISSN: None     Source Type: Journal    
DOI: 10.1139/V07-085     Document Type: Article
Times cited : (16)

References (45)
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    • D. Briggs and M.P. Seah. In Practical surface analysis. 1. 2nd ed. Wiley, Chichester, NY. 1990. p. 657.
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    • W. Malfait, Y. Morizet, W. Halter, R. Verel, and B. Meier. Geophys. Res. Abst. 7, 07324 (2005).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.